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Fully-integrated system including
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Field-proven laser source technology (Model CPA-Series)
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Multi-axis positioning system
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Beam delivery system
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Selection of processing parameters
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Class I enclosure
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Integrated, intelligent, on-axis machine vision and inspection
system
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Motion control
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Pulses �on-demand� (1, 2, � 64,000 at user- selectable repetition
rate1)
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Optional digital and/or analog IO
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Complete computer control
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Granite base mounted on pneumatic vibration isolators
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Small footprint
Over
twenty years experience with ultrashort pulse lasers combined with hundreds of
real world projects and years of processing knowhow have led to our latest
generation of femtosecond micromachining workstations. The Model UMW-Series
encompasses everything you need to micromachine with ultrashort pulse lasers.
This design benefits from our years of experience learning the optimum
combination of components, performance parameters, and software required to
micromachine materials with ultrashort pulses of light. The Model UMW Series
provides ample space for custom beam delivery and manipulation, and includes a
sophisticated machine vision and inspection system, and complete computer
control. The software interface provides powerful and intuitive access to all
system functionality including the laser, motion, and machine vision systems,
and provides advanced intercommunication between them.
Performance Parameters:
Positioning System2:
X, Y Axis |
|
Z Axis |
|
Max. Travel: |
300mm |
Max Travel: |
100mm |
Repeatability: |
0.5μm |
Repeatability: |
1.0μm |
Accuracy: |
1.0μm |
Accuracy: |
+/-1μm |
Orthogonality: |
5arc sec |
Max. Velocity: |
5cm/sec |
Max. Velocity |
5cm/sec |
|
|
Vision System:
Zoom
Lens: 12x
Resolution3: 1μm
Field
of View3: 4mm
Lighting: LED Ring and Coaxial Light
Inspection System: Pattern recognition, edge location, part rotation, part
measurement
Laser:
See
Model CPA-2101 & CPA-2110 brochures for performance parameters & features.
Enclosure:
Class
I Laser Enclosure
Warranty
Please contact us for details.
This
product protected under US patent numbers: 5,530,582; 5,572,358; 5,592,327;
5,594,256.
1.
TTL-0,+1 ΔT = 1/repetition rate
2.
Values are for the base system. Other configurations are available upon request.
3.
Resolution is for maximum magnification and depends on focusing objective; FOV
is for minimum magnification.
Ultrashort Pulse Nonlinear
Spectrometer Non-Collinear Optical
Parametric Amplifier Ti:Sapphire
Ultrashort Pulse Laser
Fully-Integrated Tunable Ultrafast Source for
Microscopy Applications
High-Average-Power Femtosecond Laser |