| 
  
The 
UV-VIS-NIR scanning spectrophotometer is a universal instrument designed 
specifically for unattended measurement of optical parts with coatings. The 
instrument is produced in six configurations relative to effective spectral 
range meeting individual customer measurement needs - from 380-1700 nm up to 
190-4500 nm.  
  
The 
configuration of the spectrophotometer in many respects changes the approach to 
the simplicity, versatility and speed of measurements. The measurement of 
absolute reflectance and transmittance at variable angles and polarization modes 
are carried out unattended and without any additional assemblies. 
  
Original optical scheme of the spectrophotometer includes a reference channel 
and provides for study of optical parts from 10mm up to 120mm in diameter. 
Extensive QA/QC analyses, research and development of advanced thin film 
materials is supported with the built-in determination of n, k, and d parameters 
in the UV-VIS-NIR range with spectrophotometric reverse engineering. 
  
The 
spectrophotometer ensures trustful measurements with a spectral resolution up to 
1.2 nm, photometric accuracy to 0.0050 and repeat accuracy up to 0.0025 in 
transmission mode meeting the modern requirements for various research studies. 
  
The 
instrument is very compact and convenient for everyday use. The body with a 
large lid offers easy and unobstructed access to the measuring compartment 
allowing the optical parts to be placed quickly and securely. 
  
The 2 
year warranty is provided as standard. 
  
Features and Capabilities 
• 
Transmittance T, Ts, Tp (for angles 0-75°) 
• 
Absolute reflectance R, Rs, Rp (for angles 8–75°) 
• 
Unattended measurement and calculation of T(s+p)/2 and R(s+p)/2 for selected 
angle of incidence 
• nkd 
determination in UV-VIS-NIR range with spectrophotometric reverse engineering 
• 
Measurement of polarizing beamsplitters 
• 
Optical density of the sample, 0 – 4 (D) 
• 
Integral values for R and T for selected spectral range 
• 
Light scattering indicatrix for transmittance and reflectance 
• 
Kinetic measurements 
• 
Color coordinates 
  
Specifications 
  
OPTICAL CONFIGURATION 
	
		| 
		 
		Optical 
		scheme of monochromator   | 
		
		 
		Cherny-Turner
		  | 
	 
	
		| 
		 
		Optics
		  | 
		
		 
		Mirror, Al 
		+ SiO2, Al+MgF2   | 
	 
	
		| 
		 
		Reference 
		channel   | 
		
		 
		Yes 
		  | 
	 
	
		| 
		 
		Wavelength 
		sampling pitch, nm   | 
		
		 
		0.5 to 100
		  | 
	 
	
		| 
		 
		Wavelength 
		scanning speed, nm/min   | 
		
		 
		3000 (at 5 
		nm wavelength sampling pitch)   | 
	 
	
		| 
		 
		Spot size 
		on the measured sample, mm   | 
		
		 
		6x1 
		  | 
	 
	
		| 
		 
		Photometric 
		functions   | 
		
		 
		%T, %R
		  | 
	 
	
		| 
		 
		Tuning 
		pitch angle of sample table   | 
		
		 
		0.1˚ 
		  | 
	 
	
		| 
		 
		Turning 
		pitch angle of photodetectors   | 
		
		 
		0.1˚ 
		  | 
	 
	
		| 
		 
		Positioning 
		accuracy of the tuning pitch angle of sample table   | 
		
		 
		0.05˚
		  | 
	 
	
		| 
		 
		Effective 
		spectral range, nm  
		
		(instrument 
		configuration options)   | 
		
		 
		190-1700, 
		190-2700, 190-4500, 380-1700, 380-2700, 380-4500   | 
	 
	
		| 
		 
		Spectral 
		resolution, nm *  
		
		190-1000 nm
		 
		
		1000-2700 
		nm  
		
		2500-4500 
		nm   | 
		
		 
		  
		
		Up to 1.2
		 
		
		Up to 2.4
		 
		
		Up to 4.8
		  | 
	 
	
		| 
		 
		Wavelength 
		accuracy, nm   | 
		
		 
		+/-0.24
		  | 
	 
	
		| 
		 
		Wavelength 
		repeat accuracy, nm   | 
		
		 
		+/-0.12
		  | 
	 
	
		| 
		 
		Scattered 
		light level, % max (@ 532 nm)   | 
		
		 
		< 0.05
		  | 
	 
	
		| 
		 
		Angle of 
		beam divergence   | 
		
		 
		2˚ 
		  | 
	 
	
		| 
		 
		Photometric 
		accuracy   | 
		
		 
		0.0050 х T
		  | 
	 
	
		| 
		 
		Photometric 
		repeat accuracy   | 
		
		 
		0.0025 х T
		  | 
	 
	
		| 
		 
		Stability 
		of baseline, %/hour **   | 
		
		 
		0.1 (30 
		minutes warm-up time)   | 
	 
	
		| 
		 
		Light 
		source   | 
		
		 
		Deuterium 
		lamp, Halogen lamp   | 
	 
	
		| 
		 
		Built-In 
		Polarizers   | 
		
		 
		
		S-polarization, P-polarization  
		
		Standard: 
		380 -2200 nm 
		
		Optional: 
		220 -2200 nm, 220-4500 nm, 380-4500 nm.   | 
	 
 
  
SAMPLE COMPARTMENT 
	
		| 
		 
		Sample 
		table   | 
		
		 
		For 
		measurement of transmission and reflection of plane samples with size 
		bigger than 12x10 mm   | 
	 
	
		| 
		 
		Independent 
		setting   | 
		
		 
		Independent 
		positioning for sample table and photodetectors unit   | 
	 
	
		| 
		 
		
		Synchronized setting   | 
		
		 
		
		Synchronized positioning for sample table and photodetectors unit 
		depending on the chosen photometric function (R or T) 
		  | 
	 
	
		| 
		 
		Size of 
		samples   | 
		
		 
		Min. 12x10 
		mm – for measurement at 0-10 deg incidence angles.  
		
		Min. 12x25 
		mm -for measurement at 10-60 deg incidence angles  
		
		Max. sample 
		size – up to Ø120mm   | 
	 
 
  
INTERFACE, 
DIMENSION AND WEIGHT 
	
		| 
		 
		Interface
		  | 
		
		 
		USB 2.0
		  | 
	 
	
		| 
		 
		Power 
		consumption, Wt   | 
		
		 
		110 
		  | 
	 
	
		| 
		 
		Power input
		  | 
		
		 
		110/220 V, 
		50/60 Hz   | 
	 
	
		| 
		 
		Width x 
		Depth x Height, mm   | 
		
		 
		420 x 610 x 
		270   | 
	 
	
		| 
		 
		Net weight, 
		kg   | 
		
		 
		35 
		  | 
	 
	
		| 
		 
		Supply set
		  | 
		
		 
		
		Spectrophotometer, Operation Manual, USB cable, power cable, software 
		package, spare halogen lamp.   | 
	 
 
* measured at 
optimum signal/noise ratio  
**after 30 minutes 
warm-up time  
  
          
		Ultrashort Pulse 
Nonlinear Spectrometer       
Photon detector  |