The
UV-VIS-NIR scanning spectrophotometer is a universal instrument designed
specifically for unattended measurement of optical parts with coatings. The
instrument is produced in six configurations relative to effective spectral
range meeting individual customer measurement needs - from 380-1700 nm up to
190-4500 nm.
The
configuration of the spectrophotometer in many respects changes the approach to
the simplicity, versatility and speed of measurements. The measurement of
absolute reflectance and transmittance at variable angles and polarization modes
are carried out unattended and without any additional assemblies.
Original optical scheme of the spectrophotometer includes a reference channel
and provides for study of optical parts from 10mm up to 120mm in diameter.
Extensive QA/QC analyses, research and development of advanced thin film
materials is supported with the built-in determination of n, k, and d parameters
in the UV-VIS-NIR range with spectrophotometric reverse engineering.
The
spectrophotometer ensures trustful measurements with a spectral resolution up to
1.2 nm, photometric accuracy to 0.0050 and repeat accuracy up to 0.0025 in
transmission mode meeting the modern requirements for various research studies.
The
instrument is very compact and convenient for everyday use. The body with a
large lid offers easy and unobstructed access to the measuring compartment
allowing the optical parts to be placed quickly and securely.
The 2
year warranty is provided as standard.
Features and Capabilities
•
Transmittance T, Ts, Tp (for angles 0-75°)
•
Absolute reflectance R, Rs, Rp (for angles 8–75°)
•
Unattended measurement and calculation of T(s+p)/2 and R(s+p)/2 for selected
angle of incidence
• nkd
determination in UV-VIS-NIR range with spectrophotometric reverse engineering
•
Measurement of polarizing beamsplitters
•
Optical density of the sample, 0 – 4 (D)
•
Integral values for R and T for selected spectral range
•
Light scattering indicatrix for transmittance and reflectance
•
Kinetic measurements
•
Color coordinates
Specifications
OPTICAL CONFIGURATION
Optical
scheme of monochromator |
Cherny-Turner
|
Optics
|
Mirror, Al
+ SiO2, Al+MgF2 |
Reference
channel |
Yes
|
Wavelength
sampling pitch, nm |
0.5 to 100
|
Wavelength
scanning speed, nm/min |
3000 (at 5
nm wavelength sampling pitch) |
Spot size
on the measured sample, mm |
6x1
|
Photometric
functions |
%T, %R
|
Tuning
pitch angle of sample table |
0.1˚
|
Turning
pitch angle of photodetectors |
0.1˚
|
Positioning
accuracy of the tuning pitch angle of sample table |
0.05˚
|
Effective
spectral range, nm
(instrument
configuration options) |
190-1700,
190-2700, 190-4500, 380-1700, 380-2700, 380-4500 |
Spectral
resolution, nm *
190-1000 nm
1000-2700
nm
2500-4500
nm |
Up to 1.2
Up to 2.4
Up to 4.8
|
Wavelength
accuracy, nm |
+/-0.24
|
Wavelength
repeat accuracy, nm |
+/-0.12
|
Scattered
light level, % max (@ 532 nm) |
< 0.05
|
Angle of
beam divergence |
2˚
|
Photometric
accuracy |
0.0050 х T
|
Photometric
repeat accuracy |
0.0025 х T
|
Stability
of baseline, %/hour ** |
0.1 (30
minutes warm-up time) |
Light
source |
Deuterium
lamp, Halogen lamp |
Built-In
Polarizers |
S-polarization, P-polarization
Standard:
380 -2200 nm
Optional:
220 -2200 nm, 220-4500 nm, 380-4500 nm. |
SAMPLE COMPARTMENT
Sample
table |
For
measurement of transmission and reflection of plane samples with size
bigger than 12x10 mm |
Independent
setting |
Independent
positioning for sample table and photodetectors unit |
Synchronized setting |
Synchronized positioning for sample table and photodetectors unit
depending on the chosen photometric function (R or T)
|
Size of
samples |
Min. 12x10
mm – for measurement at 0-10 deg incidence angles.
Min. 12x25
mm -for measurement at 10-60 deg incidence angles
Max. sample
size – up to Ø120mm |
INTERFACE,
DIMENSION AND WEIGHT
Interface
|
USB 2.0
|
Power
consumption, Wt |
110
|
Power input
|
110/220 V,
50/60 Hz |
Width x
Depth x Height, mm |
420 x 610 x
270 |
Net weight,
kg |
35
|
Supply set
|
Spectrophotometer, Operation Manual, USB cable, power cable, software
package, spare halogen lamp. |
* measured at
optimum signal/noise ratio
**after 30 minutes
warm-up time
Ultrashort Pulse
Nonlinear Spectrometer
Photon detector |